Teachers and Students from the School of Inspection and Testing Achieved Excellent Results in the 9th National College Student Embedded Chip and System Design Competition National Finals

From August 10 to 13, 2026, the national finals of the chip application track of the 9th National College Student Embedded Chip and System Design Competition were successfully held in Nanjing. This competition was hosted by the China Education Society of Electronics and co-organized by Southeast University and the Management Committee of Nanjing Jiangbei New Area, with the theme AI Empowers Design, Design Illuminates AI.

This year's competition featured wide coverage and a record-breaking scale of participation, with 44,503 students from 17,142 teams from a total of 908 colleges and universities across China actively participating. After rounds of preliminary selections, 2,735 teams advanced to the semifinals in their respective competition zones; after a rigorous review in the semifinals, a final total of 1,227 outstanding teams from 375 colleges and universities gathered for the national finals. After a comprehensive evaluation consisting of two major stages, a comprehensive assessment and on-site testing, 189 teams from across China stood out to win the national first prize in the finals, among which only 3 were vocational colleges.

In the face of intense competition against top universities nationwide, the participating team from the School of Inspection and Testing remained composed and delivered an outstanding performance, achieving a historic breakthrough: the team, guided by teachers Chen Hong and Yan Lili, won the National First Prize for their innovative and practical work; The team guided by teachers Chen Dong and Yuan Nannan won the Second Prize in the Eastern Region (covering Jiangsu, Zhejiang, Shanghai, and Shandong), marking a major breakthrough for NJCIT in this competition.

The National College Student Embedded Chip and System Design Competition is a top-tier, authoritative, and influential academic competition in the domestic embedded field, with its outcomes widely recognized by industry enterprises. During the preparation period, the participating teachers and students made full use of their spare time and holidays to tackle difficulties, repeatedly polishing hardware prototypes, optimizing program logic, and refining design plans. They accumulated deep technical expertise through countless debugging and iteration cycles, and the innovative design and practical value of their entries received high recognition from industry experts and corporate judges.

The breakthrough in this National College Student Embedded Chip and System Design Competition has accumulated valuable experience for future discipline construction and talent cultivation. Taking this as an opportunity, the School of Inspection and Testing will further strengthen the construction of related disciplines, deepen the reform of education and teaching, continuously improve the quality of talent cultivation, and cultivate more high-quality technical and skilled talents for the industry.

Text/Photo by Chen Hong and Yan Lili, School of Inspection and Testing

Reviewed by Yuan Nannan, Ma Yongbing, School of Inspection and Testing